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Depth Charge: Using Atomic Force Microscopy to Study Subsurface Structures
Science Journal: Over the past couple of decades, atomic force microscopy (AFM) has emerged as a powerful tool for imaging surfaces at astonishing resolutions — fractions of a nanometer in some cases. But suppose you’re more concerned with what lies below the surface? Researchers at the National Institute of Standards and Technology (NIST) have shown that [...]